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Innovative Test Systems for Production, Development and Service
In-Circuit Tester
Functional Tester
Components Tester
Inline Tester
Semiconductor Tester
Boundary Scan Test
AOI Tests
News
High Speed Digital Module DM1G with 16 or 32 MSteps,
programable bit rate up to 1.5 GS/s and 6 GS/s timing
resolution in burst mode
New module XIMP20 for measurement of small capacitors
and coils
SQL-export/import functions in “CT - Test Data Logging”
TCP/IP Interface - server und client functionality included
into CT-Control Program
ParetoX-diagram - graphical visualisation of test process
in real time
Repair station with server based logging and repair data
management
High Speed Color Analyzer CDM24
Analog Module AM30-4B, 30 V, 300 mA, 24 bit
Special Features
Powerful tester operating system CTestAdvisor
•
interpreter based open system test sequencer
•
control of CT3xx combinational test systems
•
true integration of external devices, systems and software
•
CAD and test data import
•
automatic test program generation
•
test coverage analyzer, logging and statistics
•
easy connection to quality management systems
•
paperless repair
Sampling rates 1500 MS/s digital and 5 GS/s analog
Programmable levels, frequencies
Teach-in functions
Flexible concurrent use of different test methods
Replacement for different test and measurement devices
In-circuit Test, Function Test, Boundary Scan Test,
AOI-Test Functions in a single Test System
CT3XX Tester family - what does that mean for you?
Free scalable modular technology
Uniform tester bus system
Uniform tester operating software
Interchangeable modules between all tester types
Tester resources as required
Flexibility and low costs
Our customer requirements determine principle and direction of our tester developments.
Know-how, elaborated over more than 25 years, is used for testing electronic devices,
components and IC’s. We deliver test systems and complete test solutions.
Exhibitions, Appointments
Please, click here for an Appointment.
