CT300 Meteor
Modular combinational tester for
functional tests and ICT / MDA
Function test 5GS/s analog
Function test 1500 MS/s digital
ICT test pins: max. 1728 (14 Slots)
max. 2736 (21 Slots)
Parallel tests > 2500 Parts/s
Powerful test operating system
Grafical user interface
Panel and multisite test
19’’ Systems
CT300 Meteor 14 with 14 slots
CT300 Meteor 21 with 21 slots
Test coverage analysis
Paperless repair station
PCB-CAD Import
Automatic program generator
Convenient Debugging
Logging
Statistic
Self test and self adjustment
Coupling the adapter
with standard flat cables or with optional High Pin Count Interface (HPC-IF)
Controlling of In-line and handling systems
For more information, please contact us.
We sell solely to business customers, reserve technical changes. © Dr. Eschke Elektronik GmbH. All rights reserved.
