CT300 Galaxy with Cable Docking CT350 Galaxy with High Pin Count Interface
CT300- / CT350 Galaxy with High Pin Count Interface, Adapter, Monitor and integrated PC
Function Test and In-circuit Test / MDA   ICT test points: max. 2736   CAD data import   Automatic program generator   Full graphic operator screen   Powerful debugging tools   Test coverage analysis   Paperless repair station   Logging and statistic functions   High Pin Count-Interface   Fast adapter exchange   Handler and adapter controlling
Relative small footprint W x D [cm]: 75 x 65 Due to its good mobility,  the tester can be used in the test fields very versatile. Adapter control manual, pneumatic or vacuum.
High Pin Count Interface Advantage: Very fast adapter exchange
For more information, please contact us.
  Innovative combinational test   Mixed signal tests   1500 MS/s digital, 5 GS/s analog   Amplitude resolution 24 bit   Current measurement resolution 1 pA   Controlling power supplies up to 10 kW   Fast pulse measurement procedures   Interface Tester <=> PC: High Speed USB   Short test times, high throughput   Modular system   Concurrent engineering   Complete problem solutions   Fast and reliable support  Very good price-performance ratio
We sell solely to business customers, reserve technical changes. © Dr. Eschke Elektronik GmbH. All rights reserved.