Application area
- Automatic production lines
- In-line systems
- Single or multisite test
- Research and development
- Verification of prototypes
- Production characterization
- Quality assurance and service
Semiconductor-series production
IC multisite test with CT300 Meteor
parallel test of 32 chips
Semiconductor-series production
Use in German and Austrian international leading
companies
Test of CMOS camera modules and image sensors
Measurement Methods, Standard Tests
- Contact test
- Short-circuit test
- Detailed parametric tests
- Automatic waveform test
- Digital scope function
- Analog and digital high-speed tests
- Parallel IC programming
Application of the systems for testing small and large series semiconductor manufacturing
with controlling various handling systems
CT300 Satellite
Semiconductor Tester
CT300 Meteor
for Prototype verification
and series production
For more information, please contact us.
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